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Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

  • High Light

    Scratches Dusts Semiconductor Surface Detector 1.8μM

    ,

    Scratches Dusts Surface Defect Detection Equipment 1.8μM

    ,

    Surface Defect Detection Equipment 1.8μm Scratches Dusts

  • Size
    1210 Mm*1000mm* 1445mm, Customizable
  • Customizable
    Available
  • Guarantee Period
    1 Year Or Case By Case
  • Shipping Terms
    By Sea / Air / Multimodal Transport, Etc
  • Detectable Defect Type
    Scratches, Dusts
  • Resolution
    1.8μm
  • Place of Origin
    Chengdu, P.R.CHINA
  • Brand Name
    ZEIT
  • Certification
    Case by case
  • Model Number
    SDD0.5-0.5
  • Minimum Order Quantity
    1set
  • Price
    Case by case
  • Packaging Details
    Wooden case
  • Delivery Time
    Case by case
  • Payment Terms
    T/T
  • Supply Ability
    Case by case

Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM

Scratches Dusts Optical Testing Equipment Semiconductor Surface Detector 1.8μM
 
 
Applications
For the process control and yield management of blank mask in the fields of semiconductor display and
integrated circuit chip manufacturing, we use high throughput optical testing technologies to make fast and
accurate automatic detection for the surface defects of blank mask. According to professional user needs,
we have developed series of high throughput MASK inspection machines with reliable quality and high cost
performance ratio, to help glass substrate, mask and panel manufacturers to identify and monitor the mask
defects, reduce the risk of yield and improve their independent ability of R&D for core technologies.
 
Working Principle
With regards to level and type of surface defect, 4x telecentric lens, specific angle ring light and coaxial light
source are selected as the visual approach. When the device is running, the sample moves along the X
direction and the vision module carries out defect detection along the Y direction.
 
Features

 Model SDD0.5-0.5

 Performance detection

 Detectable defect type Scratches, Dusts
 Detectable defect size 1μm

 Detection accuracy
 (measured)

 100% detection of defects / collection of
 defects (scratches, dust)

 Detection efficiency

 ≤10 minutes
 ( Measured value : 350mm x 300mm Mask)

 Optical System Performance

 Resolution 1.8μm
 Magnification 40x
 Visual field 0.5mm x 0.5mm
 Blue light illumination 460nm,2.5w

 
 Motion Platform Performance
 

 
 X, Y two-axis motion
 Marble countertop flatness: 2.5μm
 Y-axis Z-direction runout precision: ≤ 10.5μm
 Y-axis Z-direction runout precision: ≤8.5μm
 

  Note: Customized production available.

                                                                                                                
Detection Images
Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM 0
 
Our Advantages
We are manufacturer.
Mature process.
Reply within 24 working hours.
 
Our ISO Certification
Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM 1
 
Parts Of Our Patents
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Parts Of Our Awards and Qualifications of R&D

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ZEIT Group, founded in 2018, is a company focused on precision optics, semiconductor materials and high-tech intelligence equipments. Based on our advantages in precision machining of core and screen, optical detection and coating, ZEIT Group has been providing our customers with complete packages of customized and standardized product solutions.

 

Concentrated on technological innovations, ZEIT Group has more than 60 domestic patents by 2022 and established very close enterprise-college-research cooperations with institutes, universities and industrial association worldwide. Through innovations, self-owned intellectual properties and building up the key process experimental teams, ZEIT Group has become a development base for incubating high-tech products and a training base for high-end personnels.