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ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

  • High Light

    ZEIT Optical Testing Equipment

    ,

    ZEIT Optical Testing Equipment Wafer Flatness Surface Defect Detection

    ,

    ZEIT Optical Testing wafer flatness Surface Defect Detection Equipment

  • Size
    820mm*700mm*760mm, Customizable
  • Customizable
    Available
  • Guarantee Period
    1 Year Or Case By Case
  • Shipping Terms
    By Sea / Air / Multimodal Transport, Etc
  • Place of Origin
    Chengdu, P.R.CHINA
  • Brand Name
    ZEIT
  • Certification
    Case by case
  • Model Number
    S1200- 150
  • Minimum Order Quantity
    1set
  • Price
    Case by case
  • Packaging Details
    Wooden case
  • Delivery Time
    Case by case
  • Payment Terms
    T/T
  • Supply Ability
    Case by case

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection

Structural Light Large Size Surface Shape Detection Equipment

 

 

Applications

Lamp reflector shape detection; wafer flatness detection; car paint surface detection; lens surface shape detection.

 

Working Principle

The display projects the structured light in stripe form, and the camera collects the structured light from the measured

surface, the collected stripe is deformed through the modulation of the measured surface, the point cloud distribution

and curvature distribution of the measured surface are calculated according to the deformation of the stripe, then the

surface shape error distribution can be obtained by comparing point cloud distribution with ideal model.

 

Features

     Model      SI200-150
     Measuring range      200×150mm2
     Transverse resolution      Conventional 0.25mm, adjustable
     Measuring precision      Absolute error: ±3μm (100mm in diameter)
     Note: Customized production available.

                                                                                                             

Detection Image

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection 0

 

Our Advantages

We are manufacturer.

Mature process.

Reply within 24 working hours.

 

Our ISO Certification

ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection 1

 

 

Parts Of Our Patents

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Parts of Our Awards and Qualifications of R&D

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